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Y. Akhtar, S. Maity, and R. C. Chandrasekharan, Generating Test Suites with High 3-Way Coverage for Software Testing, IEEE CIT, 10-17, 2016.

Y. Akhtar, S. Maity, and R. C. Chandrasekharan, Generating Test Suites with High 3-Way Coverage for Software Testing, IEEE CIT, 10-17, 2016.