Publications - BITS Pilani

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Books/Book Capters

1. Author/Co-author for 6 chapters in a book “Recent Advances in PMOS Negative Bias Temperature Instability” Edited by Souvik Mahapatra (published by Springer) 2022. https://link.springer.com/book/10.1007/978-981-16-6120-4

“Characterization of NBTI Parametric Drift”, Souvik Mahapatra, Nilesh Goel and Narendra Parihar.
“Physical Mechanism of NBTI Parametric Drift”, Souvik Mahapatra, Narendra Parihar, Subhadeep Mukhopadhyay and Nilesh Goel.
“BTI Analysis Tool (BAT) Model Framework – Generation of Interface Traps”, Souvik Mahapatra, Narendra Parihar, Subhadeep Mukhopadhyay and Nilesh Goel.
“BTI Analysis Tool (BAT) Model Framework – Interface Trap Occupancy and Hole Trapping”, Souvik Mahapatra, Narendra Parihar, Nilotpal Choudhury and Nilesh Goel.
“BAT Framework Modelling of Gate First HKMG Si Channel MOSFETs”, Souvik Mahapatra, Narendra Parihar, Nilesh Goel, Nilotpal Choudhury and Tarun Samadder.
“BAT Framework Modelling of AC NBTI: Stress Mode, Duty Cycle and Frequency”, Souvik Mahapatra, Narendra Parihar, Nilesh Goel, Nilotpal Choudhury, Tarun Samadder and Uma Sharma.

2. Editor of book “Modelling, Simulation and Intelligent Computing” Proceedings of MoSICom 2020, Edited by Nilesh Goel, Shazia Hasan, and V. Kalaichelvi. (published by Springer) https://link.springer.com/book/10.1007/978-981-15-4775-1

3. Author/Co-author for 5 chapters in a book “Fundamentals of Bias Temperature Instability in MOS Transistors” Edited by Souvik Mahapatra (published by Springer) 2016. http://link.springer.com/book/10.1007/978-81-322-2508-9

“Introduction: Bias Temperature Instability (BTI) in N and P channel MOSFETs” Souvik Mahapatra, Nilesh Goel and Subhadeep Mukhopadhyay.
“Characterization methods for BTI degradation and associated gate insulator defects” Souvik Mahapatra, Nilesh Goel, Ankush Chaudhary, Kaustubh Joshi and Subhadeep Mukhopadhyay.
“Physical mechanism of BTI degradation – modeling of process and materials dependence” Souvik Mahapatra, Kaustubh Joshi, Subhadeep Mukhopadhyay, Ankush Chaudhary and Nilesh Goel.
“Reaction-Diffusion model” Ahmed Ehteshamul Islam, Nilesh Goel, Souvik Mahapatra and Muhammad Ashraful Alam.
“Modeling of DC and AC NBTI degradation and recovery for SiON and HKMG MOSFETs” Nilesh Goel and Souvik Mahapatra.

Journal Publications

16. Aravind Satheesh, Chia-Ming Yang, Vilas Gaidhane, Neeru Sood, Nilesh Goel, Selim Bozkurt, Krishna Kumar Singh & Nikhil Bhalla, “Unconventional Breathing currents Far beyond the Quantum Tunneling Distances in Large-Gapped Nanoplasmonic Systems” Nano Letters, January 2024 https://doi.org/10.1021/acs.nanolett.3c05133

15. Siona Menezes, Picardo, Jani Babu, Shaik, Sonal Singhal and Nilesh Goel “Enabling Efficient Rate and Temporal Coding using Reliability-Aware Design of a Neuromorphic Circuit” International Journal of Circuit Theory and Application, August 2022. https://doi.org/10.1002/cta.3395

14. Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel, “Impact of various NBTI distributions on SRAM performance for FinFET technology”, Integration, Volume 83, 2022, Pages 60-66, ISSN 0167-9260, https://doi.org/10.1016/j.vlsi.2021.12.005.

13. Jani Babu Shaik, Aadhitiya V. S., Sonal Singhal, and Nilesh Goel, “Reliability-aware design of temporal neuromorphic encoder for image recognition”, International Journal of Circuit Theory and Applications. 2021; https://doi.org/10.1002/cta.3209

12. Siona Menezes Picardo, Jani Babu Shaik, Nilesh Goel and Sonal Singhal, “Integral Impact of PVT variation with NBTI degradation on SRAM dynamic and static performance metrics”, in International Journal of Electronics DOI: 10.1080/00207217.2021.1908628

11. Nilotpal Choudhury, Narendra Parihar, Nilesh Goel, A. Thirunavukkarasu and Souvik Mahapatra, "Modeling of DC - AC NBTI Stress - Recovery Time Kinetics in P-Channel Planar Bulk and FDSOI MOSFETs and FinFETs," in IEEE Journal of the Electron Devices Society, vol. 8, pp. 1281-1288, 2020, doi:10.1109/JEDS.2020.3023803.

10. Jani Babu Shaik, Sonal Singhal, Nilesh Goel, "Analysis of SRAM metrics for data dependent BTI degradation and process variability", in Integration, The VLSI Journal vol. 72, May 2020, pp. 148-162. (DOI:https://doi.org/10.1016/j.vlsi.2020.01.006)

9. Thirunavukkarasu A, Hussam Amrouch, J. Joe, Nilesh Goel, Narendra Parihar, Subhrat Mishra, Chetan K. Dabhi, Yogesh Singh Chauhan, J. Henkel, and Souvik Mahapatra., "Device to Circuit Framework for Activity- Dependent NBTI Aging in Digital Circuits," in IEEE Transactions on Electron Devices. vol. 66, no. 1, pp. 316-323, Jan. 2019. (DOI:10.1109/TED.2018.2882229)

8. Narendra Parihar, Nilesh Goel, Subhadeep Mukhopadhyay and Souvik Mahapatra, “BTI Analysis Tool-Modeling of NBTI DC, AC Stress and Recovery Time Kinetics, Nitrogen Impact, and EOL Estimation” in IEEE Transactions on Electron Devices, vol. 65, no. 2, pp. 392-403, Jan 2018. (Review Paper) (DOI:10.1109/TED.2017.2780083)

7. Subhadeep Mukhopadhyay, Narendra Parihar, Nilesh Goel and Souvik Mahapatra, "A Comprehensive DC and AC PBTI Modeling Framework for HKMG n-MOSFETs," in IEEE Transactions on Electron Devices, vol. 64, no. 4, pp. 1474-1481, April 2017. (DOI:10.1109/TED.2017.2670260)

6. Subhadeep Mukhopadhyay, Nilesh Goel and Souvik Mahapatra, "A Comparative Study of NBTI and PBTI Using Different Experimental Techniques," in IEEE Transactions on Electron Devices, vol. 63, no. 10, pp. 4038-4045, Oct. 2016. (DOI:10.1109/TED.2016.2599854)

5. Narendra Parihar, Nilesh Goel, Ankush Chaudhary and Souvik Mahapatra, "A Modeling Framework for NBTI Degradation Under Dynamic Voltage and Frequency Scaling," in IEEE Transactions on Electron Devices, vol. 63, no. 3, pp. 946-953, March 2016. (DOI:10.1109/TED.2016.2519455)

4. Nilesh Goel, Kaustubh Joshi, Subhadeep Mukhopadhyay, Nirmal Nanaware, Souvik Mahapatra, “A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs”, Microelectronics Reliability, Volume 54, Issue 3, March 2014, Pages 491-519. (Introductory Invited Paper) (DOI:https://doi.org/10.1016/j.microrel.2013.12.017)

3. Kaustubh Joshi, Subhadeep Mukhopadhyay, Nilesh Goel, Nirmal Nanaware and Souvik Mahapatra, "A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model," in IEEE Transactions on Electron Devices, vol. 61, no. 2, pp. 408-415, Feb. 2014. (DOI: 10.1109/TED.2013.2295844)

2. Nilesh Goel, Nirmal Nanaware and Souvik Mahapatra, "Ultrafast AC–DC NBTI Characterization of Deep IL Scaled HKMG p-MOSFETs," in IEEE Electron Device Letters, vol. 34, no. 12, pp. 1476-1478, Dec. 2013. (DOI:10.1109/LED.2013.2284668)

1. Souvik Mahapatra, Nilesh Goel, Sujay Desai, Shashank Gupta, Binoy Jose, Subhadeep Mukhopadhyay, Kaustubh Joshi, Ankit Jain, Ahmed Ehteshamul Islam, Muhammad Ashraful Alam, "A Comparative Study of Different Physics-Based NBTI Models," in IEEE Transactions on Electron Devices, vol. 60, no. 3, pp. 901-916, March 2013. (Invited Paper) (DOI: 10.1109/TED.2013.2238237)

Conference Publications

26. Rasmiranjan Biswal, Alok Naugarhiya, Nilesh Goel, “SEGR Analysis of Trench Gate IGBT with GaN-AlN Dielectric Stacking” IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2024.

25. Krishna Negi, Jani Babu, Siona Menezes Picardo, Sonal Singhal, and Nilesh Goel, “Aging Analysis of CMOS Based Synaptic Circuits”, IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2024.

24. S. M. Picardo, Shaik Jani Babu, S. Singhal, N. Goel, “Device Reliability Affecting Coding Schemes in Neuromorphic Circuits”, 2022 IEEE Region 10 Symposium (TENSYMP), 2022, pp. 1-6, doi: 10.1109/TENSYMP54529.2022.9864392.

23. Jani Babu Shaik, S. M. Picardo, S. Singhal, and N. Goel, “Impact of Reliability Issues and Process Variability in Neuromorphic Circuits”, 2022 IEEE Region 10 Symposium (TENSYMP), 2022, pp. 1-6, doi: 10.1109/TENSYMP54529.2022.9864348.

22. Somil Mathur, Sujit Sizon, Nilesh Goel (2021) “Identifying Exoplanets Using Deep Learning and Predicting Their Likelihood of Habitability.” In Patnaik S., Yang XS., Sethi I. (eds) Advances in Machine Learning and Computing Intelligence. Algorithms for Intelligent Systems. Springer, Singapore. https://doi.org/10.1007/978-981-15-5243-4_34

21. Aadhitiya VS, Jani Babu Shaik, Sonal Singhal, Siona M. Picardo, Nilesh Goel, “Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition," 2020 5th IEEE International Conference on Emerging Electronics (ICEE), 2020, pp. 1-4, doi: 10.1109/ICEE50728.2020.9777025

20. Avinash Kumar M, Anuj Borkute, Nilesh Goel, “Novel Multilogic gates using Quantum Dot Cellular Automata with energy dissipation analysis”, 2020 IEEE International IOT, Electronics and Mechatronics Conference (IEMTRONICS), Vancouver, BC, Canada, 2020, pp. 1-7, doi: 10.1109/IEMTRONICS51293.2020.9216348.

19. Nilotpal Choudhury, Narendra Parihar, Nilesh Goel, A. Thirunavukkarasu and Souvik Mahapatra, "A Model for Hole Trapping-Detrapping Kinetics During NBTI in p-Channel FETs: (Invited paper)," 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Penang, Malaysia, 2020, pp. 1-4, (DOI:10.1109/EDTM47692.2020.9117913).

18. Prabhleen Kaur Gill, Shaik Jani Babu, Sonal Singhal and Nilesh Goel, “FPGA Implementation of Random Feature Mapping in ELM Algorithm for Binary Classification”, In: Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer Singapore. https://doi.org/10.1007/978-981-15-4775-1_54

17. Avinash Kumar, Anuj Borkute and Nilesh Goel, “An Efficient Design of Multi-Logic Gates Using Quantum Cellular Automata Architecture”, In: Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer Singapore. https://doi.org/10.1007/978-981-15-4775-1_67

16. Siona Menezes Picardo, Jani Babu Shaik, Sakshi Sahni, Nilesh Goel and Sonal Singhal, “Analyzing the Impact of NBTI and Process Variability on Dynamic SRAM Metrics under Temperature Variations”, In: Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer Singapore. https://doi.org/10.1007/978-981-15-4775-1_66.

15. Sujith Sizon, Somil Mathur and Nilesh Goel, “Negotiating Deals Using Artificial Intelligence Models”, In: Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer Singapore. https://doi.org/10.1007/978-981-15-4775-1_41

14. Shaik Jani Babu, Anish Vipperla, Haarica Vinayaga Murthy, Chintakindi Sandhya, Siona Menezes Picardo, Sonal Singhal and Nilesh Goel, “Investigating the impact of BTI and HCI on log-domain based Mihalas-Niebur Neuron circuit”, In: Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer Singapore. https://doi.org/10.1007/978-981-15-4775-1_57

13. Sarthak Prakash Chaudhari, Jani Babu Shaik, Sonal Singhal, Nilesh Goel, "Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and after NBTI Degradation", 2018 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS), Hyderabad, pp 94-97. (DOI:10.1109/iSES.2018.00028)

12. Jani Babu Shaik, Sarthak Prakash Chaudhari, Sonal Singhal and Nilesh Goel, "Analyzing Impact of NBTI and Time-Zero Variability on Dynamic SRAM Metrics", 2018 15th IEEE India Council International Conference (INDICON), Coimbatore, India, 2018, pp. 1-5. (DOI:10.1109/INDICON45594.2018.8986975)

11. Narendra Parihar, Uma Sharma, Subhadeep Mukhopadhyay, Nilesh Goel, Ankush Chaudhary, Rakesh Rao, and Souvik Mahapatra, “Resolution of disputes concerning the physical mechanism and DC/AC stress/recovery modeling of Negative Bias Temperature Instability (NBTI) in p-MOSFETs," IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2017, pp. XT-1.1-1.1 (DOI:10.1109/IRPS.2017.7936415)

10. Nilesh Goel, Tejas Naphade and Souvik Mahapatra, "Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress," 2015 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, 2015, pp. 4A.3.1-4A.3.7. (Oral) (DOI:10.1109/IRPS.2015.7112725)

9. Nilesh Goel, Prashant Dubey, Jamil Kawa and Souvik Mahapatra, "Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages," 2015 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, 2015, pp. CA.5.1-CA.5.7. (DOI: 10.1109/IRPS.2015.7112783)

8. Nilesh Goel, Subhadeep Mukhopadhyay, Nirmal Nanaware, Sandip De, Ranjan Kumar Pandey, Kota V. R. M. Murali, Souvik Mahapatra, "A comprehensive DC/AC model for ultra-fast NBTI in deep EOT scaled HKMG p-MOSFETs," 2014 IEEE International Reliability Physics Symposium (IRPS), Waikoloa, HI, 2014, pp. 6A.4.1-6A.4.12 (DOI:10.1109/IRPS.2014.6861100)

7. Subhadeep Mukhopadhyay Kaustubh Joshi, Vipul Chaudhary, Nilesh Goel, Sandip De, Ranjan Kumar Pandey, Kota V. R. M. Murali, Souvik Mahapatra, "Trap Generation in IL and HK layers during BTI / TDDB stress in scaled HKMG N and P MOSFETs," 2014 IEEE International Reliability Physics Symposium (IRPS), Waikoloa, HI, 2014, pp. GD.3.1-GD.3.11. (DOI:10.1109/IRPS.2014.6861146)

6. Tejas Naphade, Pankaj Verma, Nilesh Goel and Souvik Mahapatra, "DC / AC BTI variability of SRAM circuits simulated using a physics-based compact model," 2014 IEEE International Reliability Physics Symposium (IRPS), Waikoloa, HI, 2014, pp. CA.2.1-CA.2.8. (DOI:10.1109/IRPS.2014.6861119)

5. Tejas Naphade, Nilesh Goel, Pradeep R. Nair and Souvik Mahapatra, "Investigation of stochastic implementation of reaction diffusion (RD) models for NBTI related interface trap generation," 2013 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, 2013, pp. XT.5.1-XT.5.11.(DOI: 10.1109/IRPS.2012.6241840)

4. Sujay Desai, Subhadeep Mukhopadhyay, Nilesh Goel, Nirmal Nanaware, Binoy Jose, Kaustubh Joshi and Souvik Mahapatra, "A comprehensive AC / DC NBTI model: Stress, recovery, frequency, duty cycle and process dependence," 2013 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, 2013, pp. XT.2.1-XT.2.11. (DOI:10.1109/IRPS.2013.6532120)

3. Kaustubh Joshi, Subhadeep Mukhopadhyay, Nilesh Goel and Souvik Mahapatra, "A consistent physical framework for N and P BTI in HKMG MOSFETs," 2012 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, 2012, pp. 5A.3.1-5A.3.10. doi: 10.1109/IRPS.2012.6241840.

2. S. Mahapatra, N. Goel and K. Joshi, "A physics-based model for NBTI in p-MOSFETs," 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Xi'an, 2012, pp. 1-4. (DOI:10.1109/ICSICT.2012.6467688)

1. Romesh Kumar Nandwana, Mahima Arrawatia, Nilesh Goel, “Design of low-voltage high performance CMOS-current feedback amplifier using indirect feedback compensated Op-Amp”, ASICON 2009 - Proceedings 2009 8th IEEE International Conference on ASIC pp. 254-257. (DOI:10.1109/ASICON.2009.5351474)

NON REFEREED PUBLICATIONS

1. Shaik Jani Babu, Rohit Singh, Siona Menezes Picardo, Nilesh Goel, and Sonal Singhal, “Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits”, IWPSD 17-19 Dec 2019.

2. Nilesh Goel, Vinuthna Vinjamuri, Harvijay Singh, Arum M., Xiying Costa and Dana Lee, “Impact of Endurance Rate on Program Erase Cycles,” 2016 International SanDisk Technology Conference (ISTC 2016), Milpitas, CA, USA, 2016.

3. Aditya Agarwal, Nilesh Goel, Shubhayan Bannerjee, Haranath Kar, “Detection of Audio Source Direction Using Autonomous Robot,” Oral presentation at the International Conference on Emerging Mechanical Technology-Macro-to-Nano EMTM2M-2007, 16-18 Feb 2007 at BITS Pilani.

4. Nilesh Goel, Aditya Agarwal, Shubhayan Bannerjee, “An Operator Interface for an Autonomous Mobile System” Got First prize in Eureka, a student paper presentation contest during Techriti 2007, annual all India technical festival organized by IIT Kanpur.

5. Aditya Agarwal, Nilesh Goel, Shubhayan Bannerjee, “Tracking of Audio Source using an Autonomous Mobile Robot” Got First prize in Student Paper Contest, at IEEE sponsored 2^nd International Conference on Wireless Communication & Sensor Networks, India, 17-19 Dec 2006.

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